As Semiconductor designs continue to scale in complexity and integration, ensuring that chips can be tested thoroughly and economically has become a strategic priority. Manufacturing defects, process variations, and subtle design issues can render even functionally correct designs unusable if they are not detected efficiently during production. Design for Testability https://mariojnswb.ivasdesign.com/60575924/low-power-design-as-a-core-competency-in-modern-vlsi-engineering
Building Long-Term Competence In VLSI Through Structured and Focused Learning
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